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215 Book Reviews Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition By Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, Joseph Michael Kluwer Academic Publishers, New York (2003) ISBN 0306472929; hardback; 688; $75.00 Often a book with a long title and many authors is referred to in shorthand. In my laboratory Scanning Electron Microscopy and X-ray Microanalysis (3rd edition) by Goldstein, Newbury, Joy, Lyman, Echlin, Lifshin, Sawyer, and Michael is often referred to simply as “the Goldstein book”—which, unfortunately, short-changes the other contributors to the work. In this case I believe it is a badge of honor and a testament to the volume’s quality and depth. My initial contact with Goldstein et al. (1st edition) was on a flight to an interview for my first job out of graduate school: running an electron probe microanalyzer (EPMA) laboratory. All I knew of EPMA and scanning electron microscopy (SEM) was learned by apprenticeship, and my knowledge of theory, sample preparation, and terminology was spotty at best. I could make the machines work but understood little of how they worked. I spent the plane ride reading as much of the first edition as I could manage. I got the job and immediately bought my laboratory a copy of the 2nd edition (alternately referred to by students as “The Big Yellow Book”). I am on my second laboratory and my 3rd edition of Goldstein et al. As someone who manages a research and service laboratory, and teaches both the SEM and EMPA, it is the single volume that I reach for when a student has a question, I have a problem, or when I need to clarify part of a lecture. A ten year gap exists between the 2nd and 3rd editions and additions to the current text reflect this. Updated topics include in-depth discussions of variable pressure systems, low-voltage SEM, field-emission SEM systems, inlens detectors, quantitative digital x-ray mapping, and electron backscatter diffraction among others. Despite the updates there; is much that a reader of the 2nd edition would recognize in the 3rd. This continuity is strength rather than weakness. Electron microscopy and microanalysis have matured to the point that the basic theory and operation of the core instrumentation remain stable while dramatic changes occur in electronics, image and data processing, detector design, etc. By nature, hard-copy texts are invariably behind the curve of some technological advances, and the 3rd edition of Goldstein et al. is no exception. However, by maintaining rigorous discussions of the fundamentals while integrating new technologies and applications, the authors have produced a text with a long “shelf-life.” As with the 2nd edition, the 3rd should be useful to the reader years after its initial publication. As a whole, the volume is comprehensive and physically large. It was no exaggeration that the 2nd edition was referred to as “The Big Yellow Book.” The table of contents is detailed and informative. The organization of the text is straightforward, modular, and covers nearly any topic in SEM and x-ray microanalysis literally from astigmatism to ZAF factors. Despite the multiple contributing authors, the text speaks with a single readable voice—by the 3rd edition the authors have mastered their style of presentation. The text is well-illustrated with copious figures, diagrams, and tables. The figures alone make the book worth owning. Chapters 1 through 4 provide a thorough introduction to modes of operation for the SEM beam-sample interaction, and image formation, and chapters 6 through 9 cover x-ray microanalysis including an in-depth discussion of the distinctions between energy dispersive (EDS) and wavelength dispersive (WDS) x-ray microanalysis—a topic that often thoroughly confuses a new student. The final chapters, 11 through 15, may be the most useful as they cover the practical but critical aspects of sample preparation. Nothing in electron microscopy and microanalysis requires a broader set of skills or experience than sample preparation. The 3rd edition provides a wide-ranging discussion of hard materials (Chapt. 11 on rocks, metals, ceramics, semiconductors, etc.), polymers (Chapt. 12), biological specimens (Chapt. 13), and low-temperature techniques such as cryofracturing/cryosectioning and quench cooling (Chapt. 14). Chapter 15 is devoted entirely to the recognition and elimination of charging effects in non-conducting samples. Students in my introductory SEM class invariably ask questions that I was not expecting, or never thought about before. One example: “Why does the secondary electron image appear from the perspective of the electron beam and not the secondary electron detector?” Even if you understand the concept, this question is not easy to explain to a new user. Chapter 4 provides a discussion and illustration of a light-optical analogy for an Everhart-Thornley detector that clears up the confusion for both student and instructor! Also, the authors make important distinctions that I try to impress on students in my instrumentation classes. An example is the subtle but important differences in the operation, application, and evolution of the SEM versus the EPMA. Another is a thorough discussion of the importance of qualitative x-ray analysis—the science and art of proper peak identification (Chapt. 8)—and quantitative analysis (Chapt. 9). As anyone who works with x-ray microanalysis knows, the new student or novice user often rushes to “quantify” misidentified peaks! My problems with the book are generally minor. The index could be more clearly constructed. The locations of some topics in the index are not where I logically expect (Book Reviews continued on page 216) 216 Scanning Vol. 27, 4 (2005) (Book Reviews, continued) them to be. One example: detectability limit that is discussed in some detail in Chapter 9 but is not listed in the index. The accompanying CD-ROM is a nice idea in that it compiles databases, figures, and images that only advanced users might need, thus keeping a large volume from becoming even larger! It is well-organized and easy to use. However, except for the Monte Carlo simulation program—which is a useful classroom tool, I rarely use the CD. The book gets my praises for its breadth and depth of topics covered. However, the book is physically large and covers far more than I would assign a student to read for a class. Although well-written, readers should be warned that some discussions are dense and discussed in great detail. If an instructor is looking for a practical textbook for an introductory-level microscopy or microanalysis class, this is not it. Then again, as an old professor of mine once said: “Textbooks are crutches,” and I do not think that the authors intend the book to be a practical introductory textbook. In a perfect world Goldstein et al. could perhaps be convinced to update their 1990 Laboratory Workbook? There is no other single volume that covers as much theory and practice of SEM or x-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis [3rd edition] does. It is clearly written, well organized, and, unlike many books in the genre, reasonably priced. This is a reference text that no SEM or EPMA laboratory should be without. Electron microscopy and microanalysis are not subjects one can learn from a book—they are learned by doing. However, Scanning Electron Microscopy and X-ray Microanalysis is a trusted companion for the new student, the frazzled laboratory manager, and the veteran microscopist alike. Thomas J. Williams College of Science and Department of Geological Sciences University of Idaho Moscow, ID, USA